ADRESS 2.0 Resonant Inelastic X-Ray Scattering instrument

ra-high-vacuum Resonant Inelastic X-ray Scattering (RIXS) instrument, consisting of a RIXS spectrometer and a RIXS sample chamber, is required. The ADRESS 2.0 beamline covers an energy range from 250 eV to 1700 eV with variable polarization control.

For the activities at the soft x-ray beamline ADRESS 2.0 of the Swiss Light Source 2.0 (SLS 2.0) at the Paul Scherrer Institute a new experimental ultra-high-vacuum Resonant Inelastic X-ray Scattering (RIXS) instrument, consisting of a RIXS spectrometer and a RIXS sample chamber, is required. The ADRESS 2.0 beamline covers an energy range from 250 eV to 1700 eV with variable polarization control. The RIXS spectrometer needs to be designed to allow the possibility of being lifted by air-pads and rotated around the RIXS sample chamber on a granite floor with a range of ≥130 deg.